ES62X-LVS Low Voltage Surge System

1. Description

The Model ES62X-LVS Low Voltage Surge System, outputting lightning characteristic waveforms described in the IEC 61000-4-5, GR-1089-CORE, and C62.45-2002 standards, is designed for testing the surge immunity of devices at both wafer and package levels. Determination of ESD failure thresholds is made easy using one of the available ESD waveforms and curve tracing capabilities.

The pulse source design and pulse source delivery method ensures waveform performance directly at the device under test, not at the generator output. Current waveforms can be captured and analyzed for each ESD event. In addition, voltage waveforms can be captured and used to determine the turn-on level of protection structures. They can also be used as a means of failure determination, as the voltage waveforms show changes after pulse events.

2. Features

• Waveform clean and linear from 1V to 500 V

• Fully isolated surge pulsing circuit

• Software controlled automatic measurement

• Automatic failure detection includes DC spot check and static IV

3. Applications

• Test the surge pulse immunity for power supply, drive PCBs, communication systems, LCD display panels per IEC61000-4-5 8/20µs specification

• Test the surge pulse immunity for wafer, packaged and PCB surge/OS immunity

• 10/1000µs test for wafer, packaged, PCB and system surge immunity

4. Specifications

5. Ordering Information